Introduction

Surface analysis has proven an invaluable tool in solving a number of difficult technological problems in addition to providing an atomic description of the solid surface. The necessary instrumentation is complex and expensive, thus the need for a surface analysis laboratory equipped with state-of-the-art instrumentation which is run and supervised by skilled research personnel.

Capability

Virginia Tech Chemistry Department has purchased surface analysis equipment from Perkin-Elmer, Physical Electronics Division. The instrumentation available include a model 5400 X-ray Photoelectron Spectrometer (XPS or ESCA) which can be used for angular dependent measurements and is equipped with Mg and Al anodes and a position sensitive detector. The XPS system also includes the capability for ion scattering spectroscopy (ISS). The model 610 scanning Auger system (AES) uses a single pass cylindrical mirror analyzer with electron excitation from a coaxial electron gun. The minimum electron beam diameter is <100nm. The secondary ion mass spectrometer (SIMS), model 3500, incorporates a 90 degree spherical sector ion energy filter and a quadruple mass analyzer. The system is capable of detecting positive and negative secondary ions in the 2-1000 amu mass range.

Personnel

Mr. Frank Cromer540-231-6604
Dr. John Dillard540-231-6926
Dr. James P. Wightman540-231-5854