Cross-Reference of Surface Analytical Techniques

Introduction

Many important chemical processes occur at the surface of a solid. Some examples include catalysis, electrochemistry, and adhesion. Understanding these processes requires an understanding of the composition and structure of the surfaces. The links listed below lead to descriptions of analytical techniques that can selectively characterize solid surfaces. They are divided into two categories: techniques that are primarily used for elemental analysis at surfaces, and techniques primarily used for surface imaging.

Related analytical techniques are in a cross-reference listing for bulk materials.

Electron Spectroscopies

• Auger electron spectroscopy (AES)
• Secondary-ion mass spectrometry (SIMS)
• X-ray photoelectron spectroscopy (XPS)

Molecular Spectroscopies

• Raman spectroscopy
• Fourier transform infrared spectroscopy (FTIR)

Surface diffraction and imaging techniques

• Atomic-force microscopy (AFM)
• Extended X-ray Absorption Fine Structure (EXAFS)
• electron diffraction (RHEED and LEED)
• Near-field optical microscopy (NFOM)
• Scanning-electron microscopy (SEM)
• Scanning-tunneling microscopy (STM)