Surface Analysis Laboratory - Virginia Tech
Surface analysis has proven an invaluable tool in solving a number of difficult technological problems in addition to providing an atomic description of the solid surface. The necessary instrumentation is complex and expensive and thus the need for a surface analysis laboratory equipped with stat-of-the-art instrumentation which is run and supervised by skilled research personnel.
Capability
The University Chemistry Department has recently purchased surface analysis equipment from Perkin-Elmer, Physical Electronics Division. The instrumentation available includes a model 5300 x-ray photoelectron spectrometer (XPS or ESCA) which can be used for angular dependence measurements and is equipped with Mg, Al, and Ti anodes and a position sensitive detector. The model 610 scanning Auger system (AES), uses a single pass cylindrical mirror analyzer with electron excitation from a coaxial electon gun. the minimum electron beam diameter is <100 nm. The secondary ion mass spectrometer (SIMS), model 3500, incorporates a 90° spherical sector ion energy filter and a quadrupole mass analyzer. The system is capable of detecting positive and negative secondary ions in the 2-1000 amu mass range.
XPS or ESCA: Atomic composition; bonding state; angular dependent measurements.
AES: Atomic composition; rapid analysis; depth profiling
SIMS: Positive and negative ion spectra; depth profiling.
SEM: scanning electron microscopy.
Contact Information
Mr. Frank Cromer
540-231-6604
8 Hahn Hall
tcromer@vt.edu
Mailing Address:
Surface Analysis Laboratory
Chemistry Department
Virginia Tech
Blacksburg, VA 24061
USA
